Efficient differential charge pump with sense and common mode control

ABSTRACT

A differential charge pump circuit for use in a phase-locked loop (PLL) circuit is disclosed. The circuit includes a reference current, two sense amplifiers, a common mode control amplifier, and an h-bridge circuit. The h-bridge circuit is coupled to the reference current and the common mode control amplifier. The reference current drives a first portion of the h-bridge circuit and the common mode control amplifier controls a second portion of the h-bridge circuit. The h-bridge circuit also includes first and second nodes. The circuit controls a voltage at the first node so that it is substantially equal to a voltage at the second node for a plurality of voltages at the second node.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of co-pending U.S. patent applicationSer. No. 15/825,903, filed Nov. 29, 2017. The aforementioned relatedpatent application is herein incorporated by reference in its entirety.

BACKGROUND

The present disclosure generally relates to a differential charge pumpfor use in an electronic circuit, such as a phase-locked loop (PLL)circuit.

In a computer or other electronic system, clock signals are used tocontrol and sequence the flow of data between sequential storageelements, such as registers or latches on an integrated circuit (IC). Aclock circuit including a PLL can maintain precise phase relationshipsbetween a reference clock signal and a distributed clock signal thatsequences digital logic or other circuit elements. Precise clock phaserelationships may be useful in achieving known and efficient timingrelationships between sequential logic elements.

A PLL circuit detects phase differences between a reference clock signaland a distributed clock signal, and generates control signals based onthose phase differences. The control signals may be used to adjust thetiming and/or frequency of a clock generation circuit such as avoltage-controlled oscillator (VCO), the output of which can bedistributed to a plurality of logic or other circuit elements. Such aclock can be used in numerous elements in an integrated circuit,including a microprocessor, memory controller, graphics controller, andothers.

SUMMARY

Embodiments described herein include circuits and systems relating to adifferential charge pump. Embodiments include a differential charge pumpcircuit, including a first sensing operational amplifier, a controllingoperational amplifier, and an h-bridge circuit coupled to thecontrolling operational amplifier. The controlling operational amplifiercontrols a portion of the h-bridge circuit. The h-bridge circuitincludes a first node and a second node. The circuit is configured tocontrol a voltage at the first node so that the voltage at the firstnode is substantially equal to a voltage at the second node for aplurality of voltages at the second node.

Embodiments further include a system including a phase detectorconfigured to generate a first output signal related to a difference inphase between a received reference signal and a received feedbacksignal, a filter circuit, and a variable frequency oscillator configuredto generate a second output signal. The feedback signal received by thephase detector is based on the second output signal. The system furtherincludes a differential charge pump circuit configured to generate asignal across the filter circuit that is based on the first outputsignal. The differential charge pump circuit includes a first sensingoperational amplifier, a controlling operational amplifier, and anh-bridge circuit coupled to the controlling operational amplifier. Thecontrolling operational amplifier controls a portion of the h-bridgecircuit. The h-bridge circuit includes a first node and a second node.The h-bridge circuit is configured to control a voltage at the firstnode so that the voltage at the first node is substantially equal to avoltage at the second node for a plurality of voltages at the secondnode.

Embodiments further include a differential charge pump circuit includinga sensing operational amplifier and an h-bridge circuit. The h-bridgecircuit includes a first node and a second node. The differential chargepump circuit is configured to control a voltage at the first node sothat it is substantially equal to a voltage at the second node for aplurality of voltages at the second node. The h-bridge circuit furtherincludes a first transistor coupled to the first node and the secondnode. The voltage at the first node is controlled using the firstsensing operational amplifier and the first transistor.

Embodiments further include a differential charge pump circuit includinga first independent current source, a second independent current source,and an h-bridge circuit coupled to the first and second independentcurrent sources. The first independent current source drives a firstportion of the h-bridge circuit and the second independent currentsource drives a second portion of the h-bridge circuit. The h-bridgecircuit is configured to control a voltage at a first node of theh-bridge circuit so that the voltage at the first node is substantiallyequal to a voltage at a second node of the h-bridge circuit for aplurality of voltages at the second node.

Embodiments further include a phase-locked loop circuit including aphase detector configured to generate a first output signal related to adifference in phase between a received reference signal and a receivedfeedback signal, a filter circuit, and a variable frequency oscillatorconfigured to generate a second output signal. The feedback signalreceived by the phase detector is based on the second output signal. Thephase-locked loop circuit further includes a differential charge pumpcircuit configured to generate a signal across the filter circuit thatis based on the first output signal. The differential charge pumpcircuit includes a sensing operational amplifier, and an h-bridgecircuit. The h-bridge circuit includes a first node, and a second node.The differential charge pump circuit is configured to control a voltageat the first node so that it is substantially equal to a voltage at thesecond node for a plurality of voltages at the second node. The h-bridgecircuit further includes a first transistor coupled to the first nodeand the second node. The voltage at the first node is controlled usingthe sensing operational amplifier and the first transistor.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

FIG. 1 illustrates an example PLL circuit, according to one embodimentdescribed herein.

FIG. 2 illustrates a differential charge pump circuit, according to oneembodiment described herein.

FIG. 3 illustrates a sense amplifier circuit, according to oneembodiment described herein.

FIG. 4 illustrates another differential charge pump circuit, accordingto one embodiment described herein.

FIG. 5 illustrates example voltage levels at different nodes in thedifferential charge pump circuit of FIG. 4, according to one embodimentdescribed herein.

FIG. 6 illustrates example current between transistors in thedifferential charge pump circuits of FIGS. 2 and 4, according to oneembodiment described herein.

DETAILED DESCRIPTION

A differential charge pump can be used in a PLL circuit. Thedifferential charge pump can be used to help control the operation of avariable frequency oscillator based on a difference between a referencesignal and a feedback signal in the PLL. Such a differential charge pumpcan include an h-bridge circuit, which drives current across alternatepaths as part of the charge pump operation. But in certaincircumstances, use of the h-bridge circuit to drive current acrossalternate paths can create a voltage disparity between alternate nodeson the alternate paths. This can increase charge sharing and jitter inthe PLL circuit. To reduce this problem, the voltage at one of the nodescan be controlled to match the voltage at the alternate node, reducingthe charge sharing and jitter and improving the operation of thedifferential charge pump and PLL.

FIG. 1 is a block diagram illustrating a phase-locked loop (PLL)circuit. The PLL circuit 100 generally includes a phase detector 110, acharge pump 120, a loop filter 130, a variable frequency oscillator 140,a forward divide 150, and a feedback divide 160. The phase detector 110may have any suitable implementation, such as an analog phase detector,a digital phase detector, and so forth. The phase detector 110 generallyoperates to produce a phase difference signal that represents adifference in phase between a reference signal 102 and a feedback signal162. The feedback signal 162 is based on an output signal of thevariable frequency oscillator 140.

The signal output by the phase detector 110 includes an increase signal(INC) 112 component outputted by the phase detector 110 on a firstconnection (such as a conductive wire or trace) with the charge pump120, and a decrease signal (DEC) 114 component outputted on a secondconnection with the charge pump 120. In some cases, the INC 112 and DEC114 signals may be pulses having widths based on the determined phasedifference. For example, if the feedback signal 162 has a higherfrequency than the reference signal 102, the phase detector 110 producesa pulse on the DEC 114 (e.g., drive the line “high” for a period) whileholding the INC 112 at a fixed voltage (e.g., ground or other logical“low” voltage).

The pulses of the DEC 114 signal affects the operation of the chargepump 120, which will in turn reduce the frequency of the variablefrequency oscillator 140, reducing the output frequency toward thefrequency of reference signal 102. In other implementations of the phasedetector 110, the pulses of the INC 112 and DEC 114 signals can be atleast partly overlapping. For example, pulse(s) of the INC 112 signalmay be contemporaneous with pulse(s) of the DEC 114 signal, but thepulse(s) of INC 112 signal have a shorter duration and/or may be fewerin number to reduce output frequency of the variable frequencyoscillator 140.

The charge pump 120 receives the INC 112 and DEC 114 signals and outputsa signal across the loop filter 130, which can control the operation ofthe variable frequency oscillator 140. The signal output by the chargepump 120 includes a FILT component 122 and a FILTN component 124. Insome embodiments, the FILTN component 124 represents a substantiallyinverted copy of the FILT component 122. The FILT and FILTN componentscan alternately be referred to as OUT and OUTN components. The chargepump 120 can be coupled to the loop filter 130 through any suitablecomponent, such as a conductive wire or trace. In some embodiments, thecharge pump 120 can be coupled to the variable frequency oscillator 140through a continuous wire, and the loop filter 130 can branch off fromthe wire connecting the charge pump 120 to the variable frequencyoscillator 140.

The loop filter 130 may include any number of elements selected tocontrol dynamics of the control loop (here, PLL circuit 100). In someembodiments, the loop filter 130 is a low-pass filter comprising acapacitive element. In some embodiments, the loop filter may includeproportional elements, high-pass filter elements, etc.

The variable frequency oscillator 140 produces an output signal based onthe received signal from the loop filter 130. The variable frequencyoscillator 140 may have any suitable implementation, such as avoltage-controlled oscillator (VCO), a numerically controlled oscillator(NCO), and so forth. In some embodiments, the output signal fromvariable frequency oscillator 140 is processed through a forward divide150 and feedback divide 160. In other embodiments, the feedback signal162 is the output signal from the variable frequency oscillator 140.

While the PLL circuit 100 is illustrated in FIG. 1, a person of ordinaryskill in the art will recognize that the charge pump 120, and associatedcircuitry, is applicable to various other analog and/or digital controlloop circuits. If the charge pump 120 is used as part of a PLL circuit,the PLL circuit can be located on an integrated circuit (IC) device. Asdiscussed above, the PLL circuit can act as a clock for amicroprocessor, memory controller, graphics controller, or any othersuitable component. The PLL circuit can be located on the same IC as thedevice for which it is acting as a clock, it can be located on adifferent IC, or it can be distributed across multiple ICs.

FIG. 2 illustrates an exemplary charge pump circuit 200. The charge pump200 represents one possible configuration of the charge pump 120described in FIG. 1. Nodes OUT and OUTN in the differential charge pump200 can be used as control voltages for the variable frequencyoscillator. For example, OUT can be equivalent to the signal FILT 122 inFIG. 1 and OUTN can be equivalent to the signal FILTN 124 in FIG. 1. Inone embodiment, OUTN can be the inverse of OUT.

The differential charge pump 200 further includes h-bridge 230, whichincludes a number of transistors used to switch current into, and outof, the loop filter 250 to control the frequency of the variablefrequency oscillator. These transistors are illustrated and described asp-channel metal-oxide-semiconductor field-effect transistors (PFET) andn-channel metal-oxide-semiconductor field-effect transistors (NFET),respectively, but any suitable type of transistor or switching devicemay be used.

The differential charge pump 200 can further include nodes SENSE andSENSEN, where SENSEN is the inverse of SENSE. In order to minimizecharge sharing, and therefore noise and jitter, in the circuit, a pairof sense operational amplifiers (op-amps), OPSEN 204 and OPSENN 206 canbe used force the SENSE and SENSEN nodes to the same voltages as the OUTand OUTN nodes. An example circuit relating to the amplifiers OPSEN 204and OPSENN 206 is discussed in more detail with regard to FIG. 3.

Biasing the SENSE and SENSEN nodes to match the voltages at the OUT andOUTN nodes decreases the noise on the OUT and OUTN nodes as thetransistors in the h-bridge operate. In further embodiments, the chargepump 200 can include many h-bridge devices in parallel with theSENSE/SENSEN and OUT/OUTN nodes to get varying amounts of charge pumpcurrent. The total OUT/OUTN and SENSE/SENSEN current can vary based onimplementation and other factors, but in some embodiments the currentranges from 0.4 to 0.8 mA.

Describing FIG. 2 in more detail, a circuit 210 includes fourtransistors. These transistors average the input signals 212 and 214 togenerate a common mode voltage source VCM. While not depicted in thefigures, in an embodiment, input signal 212 can be coupled to the OUTNnode, and input signal 214 can be coupled to the OUT node. Further, theNFET transistors in circuit 210 can be coupled to a voltage source andthe PFET transistors can be coupled to ground. The common mode voltagesource VCM is coupled to the input of an amplifier OPCM 202. The outputof amplifier OPCM 202 is applied to the gates of the transistors T11 andT12. Voltage sources VR 222 and VR 224 are coupled to the transistorsT11 and T12, respectively. Elements labeled VR in the drawings andwritten description are voltage sources, sometimes abbreviated as VDD.Elements labeled GA in the figures and written description are grounds,sometimes abbreviated as GND. The h-bridge 230 operates to steer currentbased, for example, on feedback from the phase detector 110 discussedwith regard to FIG. 1.

Starting on the right side of FIG. 1, the transistor T11 is coupled tothe transistors T9 and T8. The transistor T9 is coupled to the SENSEnode. The transistor T8 is coupled to the OUT node. The transistors T10and T7 are coupled to the transistor T4. The INC signal is applied tothe gate of the transistor T9. The INCN signal is applied to the gate ofthe transistor T8. The DEC signal is applied to the gate of thetransistor T7. The DECN signal is applied to the gate of the transistorT10. The INC and DEC signals can be, for example, the signals discussedwith reference to FIG. 1. In an embodiment, the INCN signal can be theinverse of the INC signal, and the DECN signal can be the inverse of theDEC signal. Although not illustrated in the figures, inverters may beincluded to produce the INCN signal from the INC signal and the DECNsignal from the DEC signal.

When the circuit is operating, current flows from node 260 to node 262and from node 264 to node 266. The path through the h-bridge 230 isselected based on the INC and DEC signals. For example, in a PLL circuitlike the PLL circuit 100 illustrated in FIG. 1, assume that thereference signal 102 matches the feedback signal 162. This means thatthe frequency of the variable frequency oscillator 140 can remainunchanged. Because the phase detector 110 does not need to change thevoltage across the loop filter 130, the INC 112 and DEC 114 signals canbe held at a logical low (“0”) while the inverses, INCN and DECN will behigh (“1”).

In the circuit illustrated in FIG. 2, the PFET transistor T9 willconduct (because the value of INC at the gate of PFET transistor T9 islow), while the PFET transistor T8 will not conduct (because the valueof INCN at the gate of PFET transistor T8 is high). Similarly, the NFETtransistor T10 will conduct (because the value of DECN is high), whilethe NFET transistor T7 will not conduct (because the value of DEC islow). In this scenario, the transistors T2 and T1 along the left side ofthe h-bridge 230 will also conduct, while the transistors T3 and T5 willnot.

When the reference signal to the PLL (e.g., reference signal 102)differs from the feedback signal (e.g., feedback signal 162), the PLLwill change the voltage across the loop filter 130 to bring the signalstogether. For example, assume that the frequency of the feedback signal162 in FIG. 1 is less than the frequency of the reference signal 102.The PLL circuit increases the frequency of the variable frequencyoscillator 140 to compensate. In this scenario, the phase detector 110sends a logical high INC signal to the charge pump 120 and a logical lowDEC signal.

Returning to FIG. 2, this means that INC is high, INCN is low, DEC islow, and DECN is high. Thus PFET transistor T8 conducts (because INCN islow), while NFET transistor T7 does not (because DEC is also low). Thisincreases the voltage at the OUT node. On the left side of the h-bridge,PFET transistor T3 does not conduct (because DECN is high) while NFETtransistor T5 does conduct (INC is also high). This decreases thevoltage at the OUTN node. This change in the voltage difference betweenOUT and OUTN changes the frequency of the variable frequency oscillatorvia loop filter 250.

However, this switching by the h-bridge can create a voltage differencebetween the SENSE and OUT nodes and SENSEN and OUTN nodes which cancause undesirable charge sharing between the nodes and jitter in thecircuit. To alleviate this, the voltage level at the SENSE node can bebiased to match the voltage level at the OUT node, and the voltage levelat the SENSEN node can be biased to match the voltage level at the OUTNnode. One way to achieve this is through the use of sense amplifiersOPSEN 204 and OPSENN 206. The sense amplifiers OPSEN 204 and OPSENN 206bias the SENSE and SENSEN nodes so that the voltages track the OUT andOUTN nodes. This alleviates voltage differences when switching paths onthe h-bridge and mitigates charge sharing and jitter.

The OUT node is coupled to the loop filter 250. The loop filter 250includes two capacitors, 254 and 256, and a resistor 252. Moving to theleft side of FIG. 2, the configuration is similar to the right sidediscussed above. The transistor T12 is coupled to the transistors T2 andT3. The transistor T2 is coupled to the SENSEN node. The transistor T3is coupled to the OUTN node. The transistors T1 and T5 are coupled tothe transistor T6. The INC signal is applied to the gate of thetransistor T5. The INCN signal is applied to the gate of the transistorT1. The DEC signal is applied to the gate of the transistor T2. The DECNsignal is applied to the gate of the transistor. The INC and DEC signalscan be, for example, the signals discussed with reference to FIG. 1. Inan embodiment, the INCN signal can be the inverse of the INC signal, andthe DECN signal can be the inverse of the DEC signal.

As discussed above, the h-bridge circuit can operate to switch pathsacross transistors T1, T2, T3, and T5, depending on the values of INC,INCN, DEC, and DECN. The sense amplifier OPSENN 206 can be used to biasthe SENSEN node so that the voltage matches the voltage at the OUTNnode. Moving toward the bottom of FIG. 2, a reference current 270 andvoltage source VR 226 are applied to the gates of transistors T14, T6,and T4. Reference current 270 can act as a power supply. Transistors T14and T4 are coupled to ground GA 280.

FIG. 3 illustrates a sense amplifier circuit 300, consistent with theembodiment described in FIG. 2. As discussed with regard to FIG. 2, thecircuit illustrated in FIG. 3 can be used to bias the SENSE and SENSENnodes of differential charge pump 200 to match the voltage of the OUTand OUTN nodes. This decreases charge sharing and noise. The amplifiercircuit 300 includes op-amp 302, which can be any suitable operationalamplifier. For example, op-amp 302 can be a wide input common mode rangeop-amp.

The amplifier circuit 300 further includes a voltage source VR 310, thetransistors 322 and 324, a ground 362, a resistor 312, a capacitor 314,and another ground 364. Transistors 322 and 324 can be representative oftransistors in the differential charge pump 200 of FIG. 2. As oneexample, transistor 322 could be transistor T2 in differential chargepump 200 and transistor 324 could be transistor T1. Alternatively,transistor 322 could be transistor T9 and transistor 324 could betransistor T4. These are merely examples, and other transistorconfigurations are also possible.

While differential charge pump 200 and amplifier circuit 300 work wellfunctionally to reduce noise and jitter, the design has some drawbacks.Because the voltage in the OUT/OUTN nodes can range from 0 to thevoltage source (e.g., 0 to 1.2 V), transistors 322 and 324 arerelatively large in order to bias the SENSE and SENSEN nodes to matchthe voltage of the OUT and OUTN nodes. But in certain circumstances, forexample when the voltage at the OUT and OUTN nodes is approximately ½ ofthe voltage source (e.g., 0.6 V), a relatively high current runs betweenvoltage source VR 310 and ground GA 362. This bias current can bereferred to as a shoot-through current, and it can flow betweentransistor 322 and 324. The circuit dissipates this current, creatingproblems with self-heating and electromigration, and making it difficultto meet self-heating and electromigration requirements. Further, therelatively large size of transistors 322 and 324 increases the gain ofthe circuit and makes it more difficult to create a stable feedbackloop.

FIG. 4 illustrates a further differential charge pump circuit 400. Thedesign of the differential charge pump 400 maintains the functionaladvantages of the circuit 200 illustrated in FIG. 2, while lesseningsome of the disadvantages discussed above. A charge pump referencecurrent 470 drives ¼ of the current in the h-bridge 420 with thetransistor T12. The common mode control op-amp OPCM 402 drives anadditional ¼ of the current in the h-bridge 420 with the transistor T11.The sense amplifiers OPSEN 404 and OPSENN 406 then drive the remainingportions of the h-bridge 420.

In differential charge pump 400, amplifiers OPSEN 404 and OPSENN 406 donot need to directly bias the SENSE and SENSEN nodes to match thevoltage of the OUT and OUTN nodes. Instead, the voltage at the SENSENnode is controlled to match the voltage at the OUTN node through theamplifier OPSENN 406 driving the gate of transistor T6. As discussedabove, the charge pump reference current 470 is connected to the leftside of the h-bridge 420. As the PLL operates, the current at both thetransistor T12 and the transistor T6 approaches the charge pumpreference current 470. The amplifier OPSENN 406 uses the referencecurrent to control the voltage at SENSEN, by driving the gate oftransistor T6. This forces the SENSEN node to match the OUTN node. Toforce the SENSE node to match the OUT node, the amplifier OPSEN 404drives the gate of transistor T4. This uses the current from amplifierOPCM 402, which drives the right side of the h-bridge 420, to match thevoltages at the SENSE and OUT nodes.

In some circumstances the current from OPCM 402 may not match the chargepump reference current 470, and so the current on the left side of theh-bridge may not match the current on the right side of the h-bridge.But the operation of the PLL circuit forces the OPCM 402 to match thecurrent from the charge pump reference 470. If the current on the rightside of the h-bridge does not match the current on the left side of theh-bridge, the PLL may not be able to achieve lock because the voltage atOUT does not match the voltage at OUTN. As the PLL circuit operates, itshifts the common mode control amplifier OPCM 402 to drive the samecurrent on the right side of the h-bridge as the left side, so that thevoltages at OUT and OUTN match and the PLL can achieve lock.

In this embodiment, the amplifiers OPSEN 404 and OPSENN 406 do notdirectly bias the SENSE and SENSEN nodes, but instead only drive thegates of the transistors T4 and T6. As a result, the output ofamplifiers OPSEN 404 and OPSENN 406 can be lower than in the design ofdifferential charge pump 200. Further, the transistors T2, T1, T9, andT10 can be smaller than in the design of differential charge pump 200,and the excess current between transistors is greatly reduced. Thisreduces the self-heating and electromigration concerns in the design ofdifferential charge pump 200, as discussed above with regard to FIG. 3,while maintaining the functional advantages.

Turning to the details of FIG. 4, like differential charge pump 200illustrated in FIG. 2 differential charge pump 400 includes a circuit410 with four transistors. These transistors average the input signals412 and 414 to generate a common mode voltage source VCM. In anembodiment, input signal 412 can be coupled to the OUTN node, and inputsignal 414 can be coupled to the OUT node. Further, the NFET transistorsin circuit 410 can be coupled to a voltage source and the PFETtransistors can be coupled to ground. The common mode voltage source VCMis coupled to the input of an amplifier OPCM 402. But unlikedifferential charge pump 200, in differential charge pump 400 thevoltage source VR 422 is coupled only to the left side of the h-bridge420, through the transistor T12. On the right side of the h-bridge 420,the output of amplifier OPCM 402 is applied to the gate of thetransistor T11. In this configuration, reference current 470 drives ¼ ofthe current in the h-bridge 420, while amplifier OPCM 402 drives another¼ of the current in the h-bridge 420.

Moving down FIG. 4, in differential charge pump 400 the transistor T11is coupled to transistors T9 and T8. The transistor T9 is coupled to theSENSE node. The transistor T8 is coupled to the OUT node. Thetransistors T10 and T7 are coupled to the transistor T4. The INC signalis applied to the gate of the transistor T9. The INCN signal is appliedto the gate of the transistor T8. The DEC signal is applied to the gateof the transistor T7. The DECN signal is applied to the gate of thetransistor T10. The INC and DEC signals can be, for example, the signalsdiscussed with reference to FIG. 1. In an embodiment, the INCN signalcan be the inverse of the INC signal, and the DECN signal can be theinverse of the DEC signal.

In one embodiment, the h-bridge operates to switch current betweenalternate paths and control a variable frequency oscillator, based onthe INC, INCN, DEC, and DECN signals, in the same way as the h-bridgeillustrated in FIG. 2 with respect to differential charge pump 200.Because the switching operation of the h-pump in the charge pump 400 isthe same as the switching operation in the charge pump 200, the detailswill not be repeated.

The OUT node is coupled to an input of the sense amplifier OPSEN 404.The SENSE node is coupled to another input of the amplifier OPSEN 404.But in differential charge pump 400, the output of amplifier OPSEN 404does not feed back to the SENSE node. Instead, the output of amplifierOPSEN 404 is applied to the gate of transistor T4. The amplifier OPSEN404 is not required to directly bias the SENSE node to match the voltageof the OUT node, and so the output of amplifier OPSEN 404 does not needto be coupled to the SENSE node. This allows transistors, for exampletransistors T9 and T10, to be smaller in differential charge pump 400than in differential charge pump 200, reducing the impedance andreducing the excess current flow. The amplifier OPSEN 404 controls thevoltage of the SENSE node through driving the gate of transistor T4.

Like in differential charge pump 200, the OUT node in differentialcharge pump 400 is coupled to the loop filter 450. The loop filter 450includes two capacitors, 454 and 456, and a resistor 452. Moving to theleft side of FIG. 4, the transistor T12 is coupled to the transistors T2and T3. The transistor T2 is coupled to the SENSEN node. The transistorT3 is coupled to the OUTN node. The transistors T1 and T5 are coupled tothe transistor T6. The INC signal is applied to the gate of thetransistor T5. The INCN signal is applied to the gate of the transistorT1. The DEC signal is applied to the gate of the transistor T2. The DECNsignal is applied to the gate of the transistor T3. The INC and DECsignals can be, for example, the signals discussed with reference toFIG. 1. In one embodiment, the INCN signal can be the inverse of the INCsignal, and the DECN signal can be the inverse of the DEC signal.

Like the right side of the h-bridge, the OUTN node on the left side iscoupled to an input of the amplifier OPSENN 406. The SENSEN node iscoupled to another input of the amplifier OPSENN 406. The output ofamplifier OPSENN 406 does not feed back to the SENSEN node. Instead, theoutput of amplifier OPSENN 406 is applied to the gate of transistor T6.The amplifier OPSENN 406 is not required to bias the SENSEN node tomatch the voltage of the OUTN node, and so the output of amplifierOPSENN 406 does not need to be coupled to the SENSEN node. This allowstransistors, for example transistors T2 and T1, to be smaller indifferential charge pump 400 than in differential charge pump 200,reducing the impedance and reducing the excess current flow. Theamplifier OPSENN 406 controls the voltage of the SENSE node throughdriving the gate of transistor T4.

FIG. 5 is a chart illustrating the voltage at the SENSE, SENSEN, OUT,and OUTN nodes in the differential charge pump 400 of FIG. 4. Asdiscussed above, the differential charge pump 400 is able to match thevoltage of the SENSE node with the OUT node, and the SENSEN node withthe OUTN node, without using amplifiers OPSEN 404 and OPSENN 406 todirectly bias the voltage at the SENSE and SENSEN nodes. The result ofthis can be seen in FIG. 5, which shows the voltage at the SENSE nodenearly matching the voltage at the OUT node, and the voltage at theSENSEN node nearly matching the voltage at the OUTN node, for a varietyof different voltages of the OUT and OUTN nodes.

FIG. 6 is a chart illustrating the current flow across comparable pairsof transistors in the differential charge pump 200 illustrated in FIG. 2and the differential charge pump 400 illustrated in FIG. 4 for a varietyof voltage levels for the OUT and OUTN nodes. For example, theillustration of FIG. 6 could apply to the current flow betweentransistors T1 and T2, or T10 and T9.

FIG. 6 illustrates that the current flow is dramatically reduced. Forexample, when the voltage across the OUT and OUTN nodes is 500 mV each,the current flow between the transistors in differential charge pump 200is more than 2 mA, while the current flow between a comparable pair oftransistors in differential charge pump 400 is less than 0.01 mA. Asanother example, when the OUT voltage is 750 mV and the OUTN voltage is250 mv, the current flow between transistors in the differential chargepump 200 is approximately 2 mA, while the current flow between thecomparable transistors in differential charge pump 400 is approximately0.005 mA.

The descriptions of the various embodiments of the present inventionhave been presented for purposes of illustration, but are not intendedto be exhaustive or limited to the embodiments disclosed. Manymodifications and variations will be apparent to those of ordinary skillin the art without departing from the scope and spirit of the describedembodiments. The terminology used herein was chosen to best explain theprinciples of the embodiments, the practical application or technicalimprovement over technologies found in the marketplace, or to enableothers of ordinary skill in the art to understand the embodimentsdisclosed herein.

In the preceding, reference is made to embodiments presented in thisdisclosure. However, the scope of the present disclosure is not limitedto specific described embodiments. Instead, any combination of thefeatures and elements, whether related to different embodiments or not,is contemplated to implement and practice contemplated embodiments.Furthermore, although embodiments disclosed herein may achieveadvantages over other possible solutions or over the prior art, whetheror not a particular advantage is achieved by a given embodiment is notlimiting of the scope of the present disclosure. Thus, the precedingaspects, features, embodiments and advantages are merely illustrativeand are not considered elements or limitations of the appended claimsexcept where explicitly recited in a claim(s). Likewise, reference to“the invention” shall not be construed as a generalization of anyinventive subject matter disclosed herein and shall not be considered tobe an element or limitation of the appended claims except whereexplicitly recited in a claim(s).

The flowchart block diagrams in the Figures illustrate the architecture,functionality, and operation of possible implementations of systems andapparatuses according to various embodiments of the present invention.In some alternative implementations, the functions noted in the blockmay occur out of the order noted in the figures. For example, two blocksshown in succession may, in fact, be executed substantiallyconcurrently, or the blocks may sometimes be executed in the reverseorder, depending upon the functionality involved.

While the foregoing is directed to embodiments of the present invention,other and further embodiments of the invention may be devised withoutdeparting from the basic scope thereof, and the scope thereof isdetermined by the claims that follow.

What is claimed is:
 1. A differential charge pump circuit, comprising: afirst sensing operational amplifier; a controlling operationalamplifier; and an h-bridge circuit coupled to the controllingoperational amplifier, wherein the controlling operational amplifiercontrols a portion of the h-bridge circuit, the h-bridge circuitcomprising: a first node; and a second node, wherein the circuit isconfigured to control a voltage at the first node so that the voltage atthe first node is substantially equal to a voltage at the second nodefor a plurality of voltages at the second node.
 2. The differentialcharge pump circuit of claim 1, further comprising: a first transistor,the first transistor comprising a gate coupled to an output of the firstsensing operational amplifier, wherein the voltage at the first node iscontrolled by the first sensing operational amplifier and the firsttransistor.
 3. The differential charge pump circuit of claim 1, theh-bridge circuit further comprising: a second sensing operationalamplifier; a first inverse node, wherein the voltage at the firstinverse node is the inverse of the voltage at the first node; and asecond inverse node, wherein the voltage at the second inverse node isthe inverse of the voltage at the second node, wherein the first inversenode and the second inverse node are inputs to the second sensingoperational amplifier, and wherein the differential charge pump circuitis configured to control a voltage at the first inverse node so that itis substantially equal to a voltage at the second inverse node for aplurality of voltages at the second inverse node.
 4. The differentialcharge pump circuit of claim 3, further comprising: a first transistor,the first transistor comprising a gate coupled to an output of the firstsensing operational amplifier, wherein the voltage at the first node iscontrolled by the first sensing operational amplifier and the firsttransistor; and a second transistor, the second transistor comprising agate coupled to an output of the second sensing operational amplifier,wherein the voltage at the first inverse node is controlled by thesecond sensing operational amplifier and the second transistor.
 5. Thedifferential charge pump circuit of claim 1, wherein the first node andsecond node are each coupled to a respective input of the first sensingoperational amplifier.
 6. The differential charge pump circuit of claim1, further comprising a second sensing operational amplifier, whereinthe first sensing operational amplifier and the second sensingoperational amplifier control a second portion of the h-bridge circuit.7. The differential charge pump circuit of claim 1, further comprising asecond sensing operational amplifier, wherein the first sensingoperational amplifier is a sense amplifier, the second sensingoperational amplifier is a sense amplifier, and the controllingoperational amplifier is a common mode control amplifier.
 8. Thedifferential charge pump circuit of claim 1, wherein the differentialcharge pump is used in a phase-locked loop circuit and wherein theh-bridge circuit is used to control a variable frequency oscillator. 9.The differential charge pump circuit of claim 8, wherein the second nodeis coupled to a filter circuit as part of the phase-locked-loop circuit.10. The differential charge pump circuit of claim 1, wherein the circuitis configured to control the controlling operational amplifier so thatduring at least some of the circuit's operation a first current in theportion of the h-bridge circuit is substantially equal to a secondcurrent in a second portion of the h-bridge circuit driven by areference current.
 11. A system, comprising: a phase detector configuredto generate a first output signal related to a difference in phasebetween a received reference signal and a received feedback signal; afilter circuit; a variable frequency oscillator configured to generate asecond output signal, wherein the feedback signal received by the phasedetector is based on the second output signal; and a differential chargepump circuit configured to generate a signal across the filter circuitthat is based on the first output signal, the differential charge pumpcircuit comprising: a first sensing operational amplifier; a controllingoperational amplifier; and an h-bridge circuit coupled to thecontrolling operational amplifier, wherein the controlling operationalamplifier controls a portion of the h-bridge circuit, the h-bridgecircuit comprising: a first node; and a second node, wherein theh-bridge circuit is configured to control a voltage at the first node sothat the voltage at the first node is substantially equal to a voltageat the second node for a plurality of voltages at the second node. 12.The system of claim 11, the differential charge pump circuit furthercomprising: a first transistor, the first transistor comprising a gatecoupled to an output of the first sensing operational amplifier, whereinthe voltage at the first node is controlled by the first sensingoperational amplifier and the first transistor.
 13. The system of claim11, the h-bridge circuit further comprising: a second sensingoperational amplifier; a first inverse node, wherein the voltage at thefirst inverse node is the inverse of the voltage at the first node; anda second inverse node, wherein the voltage at the second inverse node isthe inverse of the voltage at the second node, wherein the first inversenode and the second inverse node are inputs to the second sensingoperational amplifier, and wherein the differential charge pump circuitis configured to control a voltage at the first inverse node so that itis substantially equal to a voltage at the second inverse node for aplurality of voltages at the second inverse node.
 14. The system ofclaim 13, the differential charge pump circuit further comprising: afirst transistor, the first transistor comprising a gate coupled to anoutput of the first sensing operational amplifier, wherein the voltageat the first node is controlled by the first sensing operationalamplifier and the first transistor; and a second transistor, the secondtransistor comprising a gate coupled to an output of the second sensingoperational amplifier, wherein the voltage at the first inverse node iscontrolled by the second sensing operational amplifier and the secondtransistor.
 15. The system of claim 11, wherein the first node andsecond node are each coupled to a respective input of the first sensingoperational amplifier.
 16. The system of claim 11, further comprising asecond sensing operational amplifier, wherein the first sensingoperational amplifier and the second sensing operational amplifiercontrol a second portion of the h-bridge circuit.
 17. The system ofclaim 11, further comprising a second sensing operational amplifier,wherein the first sensing operational amplifier is a sense amplifier,the second sensing operational amplifier is a sense amplifier, and thecontrolling operational amplifier is a common mode control amplifier.18. The system of claim 11, wherein the h-bridge circuit is used tocontrol the variable frequency oscillator.
 19. The system of claim 18,wherein the second node is coupled to the filter circuit.
 20. The systemof claim 11, wherein the charge pump circuit is configured to controlthe controlling operational amplifier so that during at least some ofthe circuit's operation a first current in the portion of the h-bridgecircuit is substantially equal to a second current in a second portionof the h-bridge circuit driven by a reference current.
 21. Adifferential charge pump circuit, comprising: a first sensingoperational amplifier; and an h-bridge circuit, comprising: a firstnode; a second node, wherein the differential charge pump circuit isconfigured to control a voltage at the first node so that it issubstantially equal to a voltage at the second node for a plurality ofvoltages at the second node; and a first transistor coupled to the firstnode and the second node, wherein the voltage at the first node iscontrolled using the first sensing operational amplifier and the firsttransistor.
 22. The differential charge pump circuit of claim 21, theh-bridge circuit further comprising: a second operational amplifier; afirst inverse node, wherein the voltage at the first inverse node is theinverse of the voltage at the first node; a second inverse node, whereinthe voltage at the second inverse node is the inverse of the voltage atthe second node, wherein the first inverse node and the second inversenode are inputs to the second operational amplifier, and wherein thedifferential charge pump circuit is configured to control a voltage atthe first inverse node so that it is substantially equal to a voltage atthe second inverse node for a plurality of voltages at the secondinverse node; and a second transistor, the second transistor comprisinga gate coupled to an output of the second operational amplifier, whereinthe voltage at the first inverse node is controlled by the secondoperational amplifier and the second transistor.
 23. A differentialcharge pump circuit, comprising: a first independent current source; asecond independent current source; and an h-bridge circuit coupled tothe first and second independent current sources, wherein the firstindependent current source drives a first portion of the h-bridgecircuit and the second independent current source drives a secondportion of the h-bridge circuit, wherein the h-bridge circuit isconfigured to control a voltage at a first node of the h-bridge circuitso that the voltage at the first node is substantially equal to avoltage at a second node of the h-bridge circuit for a plurality ofvoltages at the second node.
 24. The differential charge pump circuit ofclaim 23, the circuit further comprising: a sensing operationalamplifier; the h-bridge circuit further comprising: a first node; asecond node, wherein the first and second node are inputs to the sensingoperational amplifier, and wherein the circuit is configured to controla voltage at the first node so that it is substantially equal to avoltage at the second node for a plurality of voltages at the secondnode; and a first transistor coupled to the first node and the secondnode, the first transistor comprising a gate coupled to an output of thesensing operational amplifier, wherein the voltage at the first node iscontrolled by the sensing operational amplifier and the firsttransistor.
 25. A phase-locked loop circuit, comprising: a phasedetector configured to generate a first output signal related to adifference in phase between a received reference signal and a receivedfeedback signal; a filter circuit; a variable frequency oscillatorconfigured to generate a second output signal, wherein the feedbacksignal received by the phase detector is based on the second outputsignal; and a differential charge pump circuit configured to generate asignal across the filter circuit that is based on the first outputsignal, the differential charge pump circuit comprising: a sensingoperational amplifier; and an h-bridge circuit, comprising: a firstnode; a second node, wherein the differential charge pump circuit isconfigured to control a voltage at the first node so that it issubstantially equal to a voltage at the second node for a plurality ofvoltages at the second node; and a first transistor coupled to the firstnode and the second node, wherein the voltage at the first node iscontrolled using the sensing operational amplifier and the firsttransistor.